Wafer Inspection System
. Wafer Inspection System
Product Detail
. 8" and 12" can be combined by one stage
. verify by comparing the data from mapping data that prepared by last station
. confirm the die quantity and die position by high-speed scanner
. real time view interface
. for the purpose to inspect different defect of a die by combining diverse inspection systems
. costom data sheet can be saved in cloud system of the factory
. with Chinese and English vision
. with optional items and functions to fit your needs
. provide complete training and after service